Geometry Challenges in Multidie Thermal Management
By Emily Newton, EETimes | December 4, 2025

Three-dimensional, stacked semiconductor architectures create unique geometric challenges for multidie assembly, especially in managing heat. Designers must anticipate how geometry affects thermal distribution and proactively address these obstacles for successful designs.
Heat buildup causes localized hot spots
Some designers wrongly assume a die’s power use is uniform. In reality, it varies greatly, creating areas of intense, localized heat.
Relatedly, the design constraints of a three-dimensional stack largely prevent heat from traveling sideways. Instead, it usually rises, potentially transferring the heat to the dies above it. The geometrical designs of multidie assemblies also result in these products having larger horizontal dimensions than vertical ones, which can further complicate the heat buildup.
To read the full article, click here
Related Chiplet
- DPIQ Tx PICs
- IMDD Tx PICs
- Near-Packaged Optics (NPO) Chiplet Solution
- High Performance Droplet
- Interconnect Chiplet
Related News
- Benefits And Challenges In Multi-Die Assemblies
- Multi-Die Design Complicates Data Management
- Challenges In Managing Chiplet Resources
- Lam Research Introduces VECTOR® TEOS 3D to Address Critical Advanced Packaging Challenges in Chipmaking
Latest News
- NLM Photonics Samples Silicon Organic Hybrid PICs Manufactured at GlobalFoundries
- Avalanche Technology and NHanced Semiconductors Leverage Advanced 2.5D Integration to Bring Optimal SWaP and Reliability to Rad-Hard FPGAs
- Open EU Foundry status granted to innovative chiplet facility
- Siluxtek and GlobalFoundries Forge a Deep Strategic Partnership to Mass-Produce 200G/Lane Silicon Photonic Receiver Chips, Paving the Way for the Industrial Revolution of AI Computing Interconnects
- Lightwave Logic High-Speed Modulator Platform Now Available in GDS Factory PDK for GlobalFoundries Silicon Photonics Platform